| Transparency window |
500–600 nm (~100 nm only) |
1.1–8 µm (NIR–MIR, ~7 µm) |
0.4–5 µm (visible → MIR) |
0.4–2.4 µm (visible → NIR) |
0.9–1.7 µm (telecom) |
1–20 µm (extended MIR) |
0.2–5.5 µm (UV–MIR; Cr³⁺ visible bands) |
0.2–5.5 µm (UV–MIR, broadband) |
0.22–2.5 / 6–16 µm (UV–NIR + MIR; MPA gap 2.5–6 µm) |
0.4–5.5 µm (visible–MIR) |
0.35–4.5 µm (UV–MIR) |
0.19–3.5 µm (deep UV–MIR) |
0.16–3.2 µm (deep UV–MIR) |
0.25–5 µm (UV–MIR) |
0.18–3.5 µm (UV–MIR) |
0.25–2.3 µm (UV–NIR) |
0.36–7 µm (near-UV cutoff–MIR) |
0.4–6 µm (visible–MIR) |
0.4–7 µm (visible–MIR) |
0.4–5 µm (visible–MIR) |
| Refractive index (@ operating λ) |
1.56–1.60 (@ 532 nm) |
3.48 (@ 1550 nm) |
2.21 (@ 1550 nm) |
2.0 (@ 1550 nm) |
3.17 (@ 1550 nm) |
2.4–3.0 |
1.76–1.77 (@ 589 nm) |
1.76 (@ 589 nm) |
2.40–2.42 (@ 589 nm) |
2.55–2.70 (@ 589 nm) |
1.74–1.83 (@ 589 nm, biaxial) |
1.54–1.65 (@ 589 nm, biaxial) |
1.56–1.60 (@ 589 nm, biaxial) |
1.82 (@ 589 nm) |
1.54–1.55 (@ 589 nm) |
1.48–1.66 (@ 589 nm, birefringent) |
~2.4 (@ 589 nm) |
~2.4 (@ 589 nm) |
~2.5 (@ 589 nm) |
1.96–2.18 (@ 589 nm, biaxial) |
| Nonlinear index n₂ (cm²/W) |
⚠ Not measured (χ⁽³⁾ unknown) |
~4.5 × 10⁻¹⁴ (measured) |
~1.8 × 10⁻¹⁵ (χ⁽²⁾ dominant) |
~2.4 × 10⁻¹⁵ (low but stable) |
~1.5 × 10⁻¹³ (highest) |
~1–3 × 10⁻¹⁴ (measured) |
≈ sapphire host* Cr³⁺ term not isolated |
~3 × 10⁻¹⁶ (measured) |
~1.3 × 10⁻¹⁵ (measured, Z-scan) |
~2–5 × 10⁻¹⁵* (early estimates) |
χ⁽²⁾ dominant (deff ~2–3 pm/V) |
χ⁽²⁾ dominant (deff ~2 pm/V) |
χ⁽²⁾ dominant (deff ~1 pm/V) |
~6 × 10⁻¹⁶ (laser-damage lit.) |
~2–3 × 10⁻¹⁶ (≈ fused silica) |
⚠ Not established (no χ⁽³⁾ literature) |
~10⁻¹⁵ range* (not standardized) |
χ⁽²⁾ dominant (giant Pockels instead) |
Photorefractive (not a Kerr medium) |
⚠ Not established (not a switching candidate) |
| Propagation loss (dB/cm) |
⚠ Not measured (no waveguide fabricated) |
0.5–2 (residual absorption) |
0.03–0.5 (TFLN, state of the art) |
0.001–0.1 (ultra-low, record) |
1–3 (high absorption) |
0.1–1 (composition-dependent) |
⚠ Not fabricated (no PIC waveguide) |
N/A (substrate, low index contrast) |
~1–3 (research diamond PICs) |
~1–4 (research 4H-SiC PICs) |
~0.3–1 (ion-exchanged waveguides) |
⚠ Not fabricated (bulk optics only) |
⚠ Not fabricated (bulk optics only) |
~0.5–1 (waveguide-laser demos) |
⚠ Not fabricated (cf. amorphous-SiO₂ PLC <0.1) |
⚠ Not fabricated (too soft/fragile) |
~1–3 (visible-laser-diode PICs) |
~2–6* (early epitaxial thin films) |
⚠ Not fabricated (photorefractive bulk use) |
⚠ Not fabricated (bulk laser-host use) |
| Switching mechanism |
All-optical Kerr (Cr³⁺)* ⚠ hypothetical |
Thermo-optic / Carrier injection |
Electro-optic (Pockels χ⁽²⁾, proven) |
Thermo-optic (passive, slow) |
Carrier injection / EO (proven) |
All-optical (χ⁽³⁾) (proven) |
All-optical Kerr (Cr³⁺)* ⚠ hypothetical |
Passive substrate (weak intrinsic χ⁽³⁾) |
Color-center (NV/SiV) single-photon, quantum regime |
Color-center / χ⁽²⁾ (research stage) |
Electro-optic (Pockels χ⁽²⁾, proven) |
χ⁽²⁾ SHG/OPA (proven bulk optics) |
χ⁽²⁾ SHG/OPO (proven bulk optics) |
Optical gain (stimulated emission, not a switch) |
Passive / piezoelectric (no active switching) |
Passive birefringent (no active switching) |
Direct-gap gain + EO (laser diodes) |
Giant Pockels EO (χ⁽²⁾, proven) |
Photorefractive (space-charge field, slow) |
Passive birefringent + gain (no active switching) |
| Switching speed |
fs–ps (theoretical)* ⚠ never demonstrated |
~µs (TO) / ~ns (carriers) (measured) |
<100 ps (EO) (>100 GHz demonstrated) |
~µs (TO) (slow) |
~ns (carriers) (measured) |
fs–ps (χ⁽³⁾) (exp. proven) |
fs–ps (theoretical)* ⚠ never demonstrated |
N/A (passive substrate) |
~ns (color-center lifetime) |
~ns (color-center, research) |
~ns (EO Q-switching, proven) |
N/A (passive nonlinear optic) |
N/A (passive nonlinear optic) |
N/A (gain medium, not a switch) |
N/A (passive) |
N/A (passive) |
~ns (direct laser-diode modulation) |
<1 ns* (thin-film EO demos) |
ms–s (photorefractive response) |
N/A (passive/gain host) |
| Max temperature (°C) |
420°C (crystal stability) |
~125 (polymer packaging) |
~300 (Curie ~1140°C) |
~300 (stable amorphous) |
~150 (III-V degradation) |
150–200 (glass transition) |
>1,000 (oxide stability) |
>1,500 (oxide stability) |
>1,200 (inert atmosphere) |
>1,000 (wide-bandgap stability) |
~400 (optic-grade limit) |
~200 (coated-optic limit) |
~250 (coated-optic limit) |
>1,000 (garnet stability) |
~573 (α→β phase transition) |
<100 (moisture/acid sensitive) |
>1,000 (wide-bandgap stability) |
~120 (Curie limit) |
<500 (cubic sillenite limit) |
>1,000 (oxide stability) |
| Thermal conductivity (W/mK) |
3–15 (anisotropic, c vs a) |
~150 (Si substrate) |
~4.6 (insulator) |
~30 (amorphous) |
~68 (semiconductor) |
~0.2–0.5 (glass, very low) |
~35 (oxide) |
~35 (oxide) |
~2,200 (highest of any solid) |
370–490 (wide-bandgap) |
~13 (moderate) |
~1.2 (low) |
~3–5 (low) |
10–14 (moderate) |
6–12 (anisotropic) |
~4–5 (low) |
~130 (good) |
~6 (low) |
~3.1 (low) |
5–8 (low-moderate) |
| Integrated laser source |
External (Nd:YAG 532 nm) |
External (Si indirect bandgap) |
External (dielectric) |
External (dielectric) |
Native (on-chip) (direct-gap III-V) |
External (passive glass) |
Native (first laser medium, Maiman 1960[3]) |
External (undoped) Ti:Sapphire is a major doped-laser host |
External (Raman conversion possible) |
External (no native lasing) |
External (SHG/EO component only) |
External (SHG/OPA component only) |
External (SHG/OPO component only) |
Native (Nd:YAG/Yb:YAG, ubiquitous) |
External (passive optic) |
External (passive optic) |
Native (direct-gap; blue/green/UV diodes) |
External (EO/modulator component only) |
External (photorefractive component only) |
Native (Nd:YVO₄/Er:YVO₄ laser host) |
| Wafer size |
50 mm (bulk) 300 mm EoI = theoretical |
300 mm (foundry CMOS) |
150 mm (TFLN) (rapid growth) |
300 mm (CMOS-compatible) |
100–150 mm (costly III-V) |
200 mm (film deposition) |
100–150 mm (Kyropoulos/Czochralski) |
300 mm (commercial, mature) |
100–150 mm poly / cm single-crystal (CVD/HPHT) |
200 mm (commercial PVT) |
cm-scale (flux/TSSG boules) |
cm-scale (high-temp solution growth) |
cm-scale (Czochralski/TSSG) |
Several-inch boules (Czochralski, mature) |
100+ mm (mature commodity) |
cm-scale (natural/synthetic) |
150–200 mm (HVPE/MOCVD bulk) |
Sub-micron epitaxial film (MBE/PLD, not bulk) |
75–100 mm (Czochralski) |
Multi-inch boules (Czochralski, Ir crucible) |
| Maturity (TRL) |
TRL 2–3 (theoretical concept) |
TRL 9 (production volume) |
TRL 7–8 (qualification in progress) |
TRL 8–9 (active foundries) |
TRL 8–9 (mature telecom) |
TRL 4–5 (lab prototype) |
TRL 3–4 (lab prototype) |
TRL 2–3 (as active layer) |
TRL 3–5 (color-center devices) |
TRL 3–4 (lab prototype) |
TRL 1–2 (bulk optics only) |
TRL 1 (bulk optics only) |
TRL 1 (bulk optics only) |
TRL 2–3 (as logic substrate) |
TRL 1–2 (no logic demonstration) |
TRL 1 (no logic demonstration) |
TRL 5–6 (optoelectronics mature) |
TRL 3–4 (thin-film EO research) |
TRL 2 (photorefractive demos) |
TRL 2–3 (as laser host, not logic) |
| Raw material cost |
Very high (Be + Cr, autoclave) |
Low (Si Czochralski) |
Medium-high (Li + Nb) |
Low (LPCVD standard) |
High (rare In, P) |
Medium (glass melting) |
Low-Medium (mature Verneuil/Czochralski) |
Low (mature commercial industry) |
High (CVD/HPHT, single-crystal) |
Medium (power-electronics supply chain) |
Medium (specialty flux growth) |
Medium-High (slow solution growth) |
Medium (more scalable than BBO) |
Low-Medium (mature laser-crystal industry) |
Low (abundant, mature synthesis) |
Low (natural/synthetic, inexpensive) |
Medium (LED-driven, dropping) |
High (epitaxial thin film, low volume) |
Medium-High (specialty Czochralski) |
High (iridium-crucible growth) |
| Toxicity / Safety |
⚠ Beryllium (berylliosis, OSHA) |
None (inert Si) |
None (inert oxide) |
None (inert ceramic) |
Moderate (AsH₃, PH₃ in fab.) |
Moderate (As, Se, Te) |
None (low-toxicity oxide dust) |
None (inert oxide) |
None (crystal) CVD uses flammable process gases |
Low (dust irritant, no carcinogen) |
None (gray-tracking is optical, not health) |
Moderate (hygroscopic; Ba dust) |
Low (mildly hygroscopic) |
None (rare-earth supply chain only) |
⚠ Crystalline silica (IARC Group 1 — silicosis) |
None (soft/fragile, not toxic) |
Low (standard heavy-metal handling) |
Moderate (Ba dust during etch) |
Moderate (Bi compound toxicity) |
Moderate (vanadate dust inhalation) |